Open AccessCharacterization of thin-film multilayers using magnetization curves and modeling of low-angle X-ray diffraction data
Author(s) -
Michael Lane,
A. Chaiken,
R. P. Michel
Publication year - 1994
Language(s) - English
Resource type - Reports
DOI - 10.2172/96639
Subject(s) - materials science , magnetization , coercivity , annealing (glass) , thin film , silicon , diffraction , ferromagnetism , x ray crystallography , sputtering , layer (electronics) , crystallography , condensed matter physics , composite material , optics , nanotechnology , optoelectronics , chemistry , physics , quantum mechanics , magnetic field
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