Open AccessHigh gain, Fast Scan, Broad Spectrum Parallel Beam Wavelength Dispersive X-ray Spectrometer for SEM
Author(s) -
David B. O'Hara
Publication year - 2009
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/952205
Subject(s) - spectrometer , optics , scanning electron microscope , wavelength , resolution (logic) , materials science , microscope , beam (structure) , physics , computer science , artificial intelligence
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