Open AccessPROCESS MONITORING AND CONTROL WITH CHEMIN, A MINIATURIZED CCD-BASED INSTRUMENT FOR SIMULTANEOUS XRD/XRF ANALYSIS
Author(s) -
D VANIMAN,
D BISH
Publication year - 1999
Language(s) - English
Resource type - Reports
DOI - 10.2172/772939
Subject(s) - raw material , process engineering , gypsum , papermaking , process (computing) , environmental science , mineralogy , chemistry , materials science , computer science , engineering , metallurgy , pulp and paper industry , organic chemistry , operating system