Open AccessPROCESS MONITORING AND CONTROL WITH CHEMIN, A MINIATURIZED CCD-BASED INSTRUMENT FOR SIMULTANEOUS XRD/XRF ANALYSIS
Author(s) -
Dave Vaniman,
D. L. Bish,
et al.
Publication year - 1999
Language(s) - English
Resource type - Reports
DOI - 10.2172/772939
Subject(s) - raw material , process engineering , gypsum , papermaking , process (computing) , environmental science , mineralogy , chemistry , materials science , computer science , engineering , metallurgy , pulp and paper industry , organic chemistry , operating system
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