
Remote Laser Diffraction PSD Analyzer
Author(s) -
Thomas Aquinas Batcheller,
Gary Michael Huestis,
Steven Michael Bolton
Publication year - 2000
Language(s) - English
Resource type - Reports
DOI - 10.2172/764162
Subject(s) - spectrum analyzer , laser , particle size , range (aeronautics) , particle size distribution , slurry , characterization (materials science) , radiation , particle (ecology) , computer science , materials science , process engineering , optics , environmental science , nanotechnology , physics , engineering , geology , chemical engineering , oceanography , composite material
Particle size distribution (PSD) analysis of radioactive slurry samples were obtained using a modified off-the-shelf classical laser light scattering particle size analyzer. A Horiba Instruments Inc. Model La-300 PSD analyzer, which has a 0.1 to 600 micron measurement range, was modified for remote application in a hot cell (gamma radiation) environment. The general details of the modifications to this analyzer are presented in this paper. This technology provides rapid and simple PSD analysis, especially down in the fine and microscopic particle size regime. Particle size analysis of these radioactive slurries down in this smaller range was not achievable - making this technology far superior than the traditional methods used previously. Remote deployment and utilization of this technology is in an exploratory stage. The risk of malfunction in this radiation environment is countered by gaining of this tremendously useful fundamental engineering data. Successful acquisition of this data, in conjunction with other characterization analyses, provides important information that can be used in the myriad of potential radioactive waste management alternatives