Large area Czochralski silicon. Quarterly report No. 1. Texas Instruments report No. 03-76-32
Author(s) -
S. N. Rea
Publication year - 1976
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/7341693
Subject(s) - silicon , wafer , slicing , crystal (programming language) , materials science , boron , range (aeronautics) , doping , analytical chemistry (journal) , mineralogy , optoelectronics , composite material , chemistry , mechanical engineering , engineering , computer science , chromatography , programming language , organic chemistry
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