Open AccessAnalysis of effects of impurities intentionally incorporated into silicon. Second quarterly report, May 2, 1977--July 29, 1977
Author(s) -
F. M. Uno
Publication year - 1977
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7284153
Subject(s) - impurity , silicon , scrap , group (periodic table) , materials science , spectral analysis , analytical chemistry (journal) , optoelectronics , chemistry , physics , metallurgy , environmental chemistry , organic chemistry , quantum mechanics , spectroscopy
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