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Detection of faceting on (hk0) surfaces of thin gold films by diffraction in the electron microscope at 100 KV
Author(s) -
T. P. Darby,
D. Y. Guan,
R. W. Balluffi
Publication year - 1977
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/7095127
Subject(s) - faceting , reciprocal lattice , transmission electron microscopy , zone axis , materials science , diffraction , electron diffraction , optics , electron microscope , thin film , crystallography , lattice (music) , condensed matter physics , chemistry , nanotechnology , physics , acoustics

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