Open AccessProblems with the observation of primary and secondary relaxations in grain boundaries by electron microscopy
Author(s) -
R. W. Balluffi,
R. Schindler
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6918095
Subject(s) - transmission electron microscopy , grain boundary , electron microscope , relaxation (psychology) , microscopy , resolution (logic) , diffraction , electron diffraction , materials science , electron , primary (astronomy) , condensed matter physics , crystallography , molecular physics , chemical physics , chemistry , optics , physics , nanotechnology , microstructure , biology , quantum mechanics , computer science , artificial intelligence , neuroscience
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