Single-electron charging effects
Author(s) -
Salvatore Ruggiero
Publication year - 1990
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/6847344
Subject(s) - key (lock) , microwave , electron , quantum tunnelling , single point , point (geometry) , work (physics) , engineering physics , computer science , nanotechnology , physics , materials science , engineering , optoelectronics , simulation , mechanical engineering , telecommunications , nuclear physics , computer security , mathematics , geometry , computer simulation
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