
Degradation of spatial resolution in thin-foil x-ray microchemical analysis due to plural scattering of electrons
Author(s) -
M. E. Twigg
Publication year - 1982
Language(s) - English
Resource type - Reports
DOI - 10.2172/6773695
Subject(s) - monte carlo method , foil method , scattering , electron , scanning transmission electron microscopy , plural , electron scattering , spectroscopy , materials science , optics , high resolution transmission electron microscopy , computational physics , transmission electron microscopy , physics , atomic physics , nuclear physics , linguistics , statistics , philosophy , composite material , mathematics , quantum mechanics