Open AccessMaterials characterization using ion, electron, and photon probes
Author(s) -
A. W. Czanderna
Publication year - 1984
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6695745
Subject(s) - x ray photoelectron spectroscopy , auger electron spectroscopy , characterization (materials science) , rutherford backscattering spectrometry , secondary ion mass spectrometry , mass spectrometry , sputtering , analytical chemistry (journal) , ion , materials science , accelerator mass spectrometry , electron spectroscopy , chemistry , thin film , nanotechnology , physics , nuclear physics , nuclear magnetic resonance , organic chemistry , chromatography
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