Imaging of surfaces and defects of crystals. Progress report, February 16, 1977--May 1, 1978
Author(s) -
J. Cowley
Publication year - 1978
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6694315
Subject(s) - electron diffraction , transmission electron microscopy , materials science , reflection high energy electron diffraction , diffraction , scanning electron microscope , single crystal , energy filtered transmission electron microscopy , reflection (computer programming) , selected area diffraction , crystal (programming language) , thin film , electron backscatter diffraction , crystallography , optics , analytical chemistry (journal) , scanning transmission electron microscopy , chemistry , nanotechnology , physics , programming language , chromatography , computer science , composite material
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