Open AccessEffect of target thickness on characteristic projectile x-rays and REC in ion-atom collisions. [Fluorescence yield, 20 to 80 MeV, lifetime, cross sections]
Author(s) -
J. A. Tanis,
S. M. Shafroth
Publication year - 1977
Language(s) - English
Resource type - Reports
DOI - 10.2172/6366746
Subject(s) - atomic physics , ion , yield (engineering) , projectile , radiative transfer , electron , l shell , ionization , range (aeronautics) , fluorescence , atom (system on chip) , physics , electron capture , electron shell , vacancy defect , chemistry , nuclear physics , materials science , nuclear magnetic resonance , earth's magnetic field , quantum mechanics , magnetic field , computer science , composite material , thermodynamics , embedded system