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Process research on polycrystalline-silicon material (PROPSM). Quarterly report, January 1, 1983-March 31, 1983
Author(s) -
J. Čulík
Publication year - 1983
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/6282797
Subject(s) - wafer , polycrystalline silicon , materials science , optoelectronics , resistive touchscreen , electrical resistivity and conductivity , silicon , solar cell , electrical engineering , composite material , engineering , layer (electronics) , thin film transistor

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