Photovoltaic cell reliability research: investigation of accelerated stress factors and failure/degradation mechanisms in terrestrail solar cells. Fifth annual report
Author(s) -
J. W. Lathrop
Publication year - 1984
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6148286
Subject(s) - reliability (semiconductor) , crystalline silicon , solar cell , degradation (telecommunications) , photovoltaic system , materials science , amorphous silicon , polycrystalline silicon , amorphous solid , silicon , stress (linguistics) , reliability engineering , engineering physics , optoelectronics , composite material , electronic engineering , electrical engineering , engineering , chemistry , crystallography , physics , power (physics) , linguistics , philosophy , layer (electronics) , quantum mechanics , thin film transistor
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