Open AccessSmart build-in-test using the BITSI technique
Author(s) -
G. C. Bergeson
Publication year - 1989
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/6081921
Subject(s) - automatic test pattern generation , digital electronics , electronic circuit , printed circuit board , fault coverage , computer science , test compression , automatic test equipment , circuit extraction , computer hardware , fault (geology) , electronic engineering , engineering , electrical engineering , equivalent circuit , reliability engineering , voltage , geology , testability , seismology
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