The effects of synchrotron x-rays on the local structure and the recrystallization of ion-damaged Si
Author(s) -
Kin Man Yu,
Lei Wang,
W. Walukiewicz
Publication year - 1997
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/603691
Subject(s) - materials science , ion implantation , amorphous solid , ion beam , irradiation , ion , recrystallization (geology) , annealing (glass) , analytical chemistry (journal) , microprobe , crystallography , chemistry , mineralogy , paleontology , physics , organic chemistry , chromatography , nuclear physics , composite material , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom