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Characterization of quaternary metal oxide films by synchrotron x-ray fluorescence microprobe
Author(s) -
D. L. Perry,
A. C. Thompson,
R. E. Russo
Publication year - 1997
Language(s) - English
Resource type - Reports
DOI - 10.2172/603687
Subject(s) - pulsed laser deposition , materials science , thin film , laser ablation , carbon film , oxide , nanotechnology , chemical engineering , laser , metallurgy , optics , engineering , physics

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