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Advanced photoelectron spectrometer/diffractometer for studies of the atomic, electronic, and magnetic structure of surfaces, interfaces, and nanostructures
Author(s) -
R. X. Ynzunza,
E. D. Tober,
Z. Wang,
F. J. Palomares,
J. Morais,
R. Denecke,
S. A. Ryce,
J. Zaninovich,
C. Westphal,
C. E. Miner,
A. Kay,
Damien Leech,
M. G. Mellon,
K. D. Shaw,
D. M. Lind,
J. Liesegang,
Z. Hussain,
N. V. Smith,
D. A. Shirley,
C. S. Fadley
Publication year - 1997
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/603637
Subject(s) - beamline , undulator , spectrometer , diffractometer , optics , synchrotron radiation , x ray photoelectron spectroscopy , compendium , materials science , physics , radiation , nuclear magnetic resonance , beam (structure) , scanning electron microscope , archaeology , history

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