Open AccessStructural origin of Si-2p core-level shifts from Si(100)-c[4x2] surface: A spectral x-ray photoelectron diffraction study
Author(s) -
X. Chen,
B. P. Tonner,
J. D. Denlinger
Publication year - 1997
Language(s) - English
Resource type - Reports
DOI - 10.2172/603550
Subject(s) - spectral line , diffraction , x ray photoelectron spectroscopy , surface (topology) , core (optical fiber) , chemistry , scattering , crystallography , atom (system on chip) , x ray , atomic physics , molecular physics , physics , optics , nuclear magnetic resonance , geometry , mathematics , astronomy , computer science , embedded system