
High spatial resolution soft-x-ray microscopy
Author(s) -
W. MeyerIlse,
H. Medecki,
J. K. Brown
Publication year - 1997
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/603448
Subject(s) - beamline , optics , microscopy , zone plate , materials science , image resolution , optical microscope , resolution (logic) , microscope , x ray optics , focus (optics) , x ray , beam (structure) , physics , computer science , scanning electron microscope , diffraction , artificial intelligence