Open AccessDetermination of the resolution of the x-ray microscope XM-1 at beamline 6.1
Author(s) -
J. Heck,
W. MeyerIlse,
David Attwood
Publication year - 1997
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/603446
Subject(s) - monochromator , optics , beamline , condenser (optics) , zone plate , microscope , x ray optics , pinhole (optics) , physics , pinhole camera , resolution (logic) , microscopy , undulator , materials science , x ray , radiation , light source , diffraction , beam (structure) , computer science , artificial intelligence , wavelength
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