Ion microprobe mass spectrometry using sputtering atomization and resonance ionization: annual progress report
Author(s) -
Douglas E. Goeringer,
W. H. Christie,
H. S. McKown,
D. L. Donohue
Publication year - 1986
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5819356
Subject(s) - microprobe , mass spectrometry , sputtering , ionization , ion , analytical chemistry (journal) , chemistry , ion source , resonance (particle physics) , mass spectrum , ion beam , atomic physics , materials science , physics , thin film , nanotechnology , mineralogy , chromatography , organic chemistry
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