Open AccessElectron diffraction and microscopy studies of the structure of grain boundaries in silicon. MSC Report No. 4151
Author(s) -
C.B. Carter,
Helmut Foell,
D. G. Ast,
S.L. Sass
Publication year - 1980
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5691624
Subject(s) - diffraction , grain boundary , electron diffraction , reciprocal lattice , electron backscatter diffraction , crystallography , materials science , sigma , electron microscope , twist , gas electron diffraction , optics , silicon , moiré pattern , condensed matter physics , molecular physics , reflection high energy electron diffraction , chemistry , physics , geometry , microstructure , mathematics , optoelectronics , quantum mechanics
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