Quantitative analysis of defects in silicon. Silicon sheet growth development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project. Final report
Author(s) -
R. Natesh,
Jason M. Smith,
T. Bruce,
H. A. Qidwai
Publication year - 1980
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5556797
Subject(s) - silicon , etching (microfabrication) , materials science , isotropic etching , polishing , boundary (topology) , grain boundary , crystalline silicon , dislocation , optoelectronics , metallurgy , nanotechnology , composite material , mathematical analysis , microstructure , mathematics , layer (electronics)
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