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Loss minimization through recombination center identification
Author(s) -
K. W. Boeer,
FuHsing Lu
Publication year - 1989
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/5495823
Subject(s) - recombination , center (category theory) , minification , carrier lifetime , finite element method , physics , atomic physics , charge carrier , charge (physics) , chemistry , silicon , optoelectronics , quantum mechanics , thermodynamics , crystallography , mathematics , mathematical optimization , gene , biochemistry

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