Open Access(Atom probe field-ion microscopy research on silicon carbide whiskers and evaluate the position sensitive atom probe)
Author(s) -
M.K. Miller
Publication year - 1988
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5412227
Subject(s) - whiskers , silicon carbide , atom probe , atom (system on chip) , materials science , silicon , ion , irradiation , carbide , atomic physics , nanotechnology , chemistry , optoelectronics , metallurgy , composite material , physics , nuclear physics , organic chemistry , transmission electron microscopy , computer science , embedded system
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