Open AccessSoft-error susceptibility of a CMOS RAM: dependence upon power-supply voltage
Author(s) -
W A Kolasinski,
R Koga,
J B Blake,
Sarah Diehl
Publication year - 1982
Language(s) - English
Resource type - Reports
DOI - 10.2172/5079164
Subject(s) - cmos , voltage , soft error , chip , physics , bit (key) , power (physics) , biasing , krypton , electrical engineering , atomic physics , materials science , optoelectronics , electronic engineering , computer science , engineering , argon , quantum mechanics , computer security