Open AccessReview of equipment aging theory and technology. Final report
Author(s) -
S. P. Carfagno,
R. J. Gibson
Publication year - 1980
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5032834
Subject(s) - compendium , reliability engineering , reliability (semiconductor) , accelerated aging , reliability theory , nuclear power , accelerated life testing , computer science , nuclear engineering , power (physics) , engineering , failure rate , mathematics , physics , thermodynamics , nuclear physics , statistics , archaeology , weibull distribution , history
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