Open AccessBayesian reliability estimation: state of the art for the time-dependent case
Author(s) -
Robert E. Waller,
Harry F. Martz
Publication year - 1975
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/5029876
Subject(s) - bayesian probability , reliability (semiconductor) , estimation , computer science , state (computer science) , bayes estimator , statistics , data mining , reliability engineering , mathematics , artificial intelligence , algorithm , engineering , physics , power (physics) , systems engineering , quantum mechanics
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