Open AccessINVESTIGATION OF DEFECT CLUSTERS IN SILICON P--N JUNCTIONS.
Author(s) -
C. H. Irani,
Paul L. Johnson,
J. Van Meter,
C. A. Goben
Publication year - 1968
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4796446
Subject(s) - silicon , materials science , crystallography , optoelectronics , chemistry
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