Mapping residual stress fields from Vickers hardness indents using Raman microprobe spectroscopy
Author(s) -
R G Sparks,
W S Enloe,
M. A. Paesler
Publication year - 1988
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/476629
Subject(s) - microprobe , raman spectroscopy , residual stress , materials science , polarization (electrochemistry) , raman scattering , optics , analytical chemistry (journal) , chemistry , mineralogy , composite material , physics , chromatography
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