IMMERSION SPECTROPHOTOMETRY OF VAPOR-DEPOSITED INTERFERENCE FILMS.
Author(s) -
A. D. Mulford,
W. P. Ellis
Publication year - 1969
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4749126
Subject(s) - monoclinic crystal system , sapphire , photoluminescence , materials science , analytical chemistry (journal) , spectrophotometry , diffraction , chemical vapor deposition , deposition (geology) , spectral line , chemistry , optics , crystallography , nanotechnology , optoelectronics , crystal structure , environmental chemistry , chromatography , physics , laser , paleontology , astronomy , sediment , biology
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