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Evaluation of the 200 mCi $sup 55$Fe x-ray diffraction source in focusing and Debye--Scherrer analytical applications. Final report, June 15, 1969--March 14, 1972.
Author(s) -
Luther E. Preuss,
C.K. Bugenis
Publication year - 1973
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4589100
Subject(s) - scherrer equation , debye , diffraction , x ray , materials science , physics , optics , condensed matter physics

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