Open AccessATOMIC ORIGINS OF TRANSIENT NUCLEAR RADIATION EFFECTS IN ELECTRONICS
Author(s) -
Abraham Z. Snyder
Publication year - 1966
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4580045
Subject(s) - shielded cable , electromagnetic shielding , hot cell , nuclear engineering , transient (computer programming) , radiation , electronics , nuclear power , shut down , environmental science , computer science , materials science , electrical engineering , engineering , physics , nuclear physics , operating system
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