Open AccessAN ELECTRON BEAM SCANNING SYSTEM FOR MEASURING DIELECTRIC PROPERTIES. Final Report.
Author(s) -
Not Given Author
Publication year - 1967
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/4565944
Subject(s) - dielectric , scanning electron microscope , cathode ray , electron , materials science , beam (structure) , optics , optoelectronics , physics , nuclear physics , composite material
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