Open AccessTHICKNESS MEASUREMENTS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY
Author(s) -
T Bartlett,
F. Ball
Publication year - 1954
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4364910
Subject(s) - transmittance , refractive index , optics , interferometry , substrate (aquarium) , materials science , thin film , physics , nanotechnology , oceanography , geology
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