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A STUDY OF TEMPERATURE MEASUREMENT PRECISION IN DEBYE-SCHERRER SPECIMENS DURING HIGH TEMPERATURE X-RAY DIFFRACTION MEASUREMENT OF THERMAL EXPANSION
Author(s) -
Roy G. Merryman
Publication year - 1962
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/4051459
Subject(s) - thermal expansion , materials science , diffraction , x ray , debye model , temperature measurement , thermal , x ray crystallography , lattice (music) , optics , analytical chemistry (journal) , condensed matter physics , physics , thermodynamics , chemistry , composite material , acoustics , chromatography

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