Development of a Novel Electrical Characterization Technique for Measuring Hidden Joint Contacts in Weapons Cavities (LDRD Final Report 218470)
Author(s) -
Jon W. Wallace,
Ian Timmins,
John Himbele,
Isak C. Reines,
Roy Gutierrez,
Jeffery Williams
Publication year - 2022
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1887001
Subject(s) - characterization (materials science) , dislocation , wafer , materials science , orientation (vector space) , diode , computer science , mechanical engineering , engineering physics , optoelectronics , nanotechnology , engineering , composite material , geometry , mathematics
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