z-logo
open-access-imgOpen Access
Development of a Novel Electrical Characterization Technique for Measuring Hidden Joint Contacts in Weapons Cavities (LDRD Final Report 218470)
Author(s) -
Jon W. Wallace,
Ian Timmins,
John Himbele,
Isak C. Reines,
Roy Gutierrez,
Jeffery Williams
Publication year - 2022
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1887001
Subject(s) - characterization (materials science) , dislocation , wafer , materials science , orientation (vector space) , diode , computer science , mechanical engineering , engineering physics , optoelectronics , nanotechnology , engineering , composite material , geometry , mathematics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom