Open AccessX-ray Computed Tomography as a Metrology Technique for the Analysis of Additively Manufactured Material
Author(s) -
Bryan Hunter
Publication year - 2022
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1885728
Subject(s) - surface roughness , materials science , surface finish , metrology , tomography , characterization (materials science) , composite material , mechanical engineering , engineering drawing , optics , nanotechnology , physics , engineering
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