Open AccessHigh-Cycle Fatigue In Situ in the Transmission Electron Microscope.
Author(s) -
Christopher M. Barr,
Ta Nguyen Binh Duong,
Daniel Charles Bufford,
Abhilash Molkeri,
Nathan Heckman,
David H. Adams,
Ankit Srivastava,
Michael J. Demkowicz,
Brad Boyce,
Khalid Hattar
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1863859
Subject(s) - transmission electron microscopy , in situ , materials science , electron microscope , optoelectronics , optics , nanotechnology , physics , meteorology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom