Open AccessUsing EBIC to Understand Radiation Damage in Electronics.
Author(s) -
A. Alec Talin,
David S. Ashby,
Matthew Marinella,
Diana R. Garland,
György Vizkelethy,
Kim Celio,
John Cumings,
Zoey Warecki,
Juan Jillanas,
Andrew Armstrong,
Andrew A. Allerman
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1861021
Subject(s) - delocalized electron , radiation damage , radiation , electronics , optoelectronics , key (lock) , materials science , radiation hardening , computer science , nanotechnology , engineering physics , physics , optics , electrical engineering , engineering , computer security , quantum mechanics
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