Micron-scale Field Emission Model for PIC-DSMC Simulations Based on Nanoscale Surface Characterization.
Author(s) -
Christopher Moore,
Ezra Bussmann,
Taisuke Ohta,
Ashish Jindal,
Nicholas Roberds,
Matthew Hopkins
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1855332
Subject(s) - nanoscopic scale , characterization (materials science) , scale (ratio) , materials science , surface (topology) , field electron emission , field (mathematics) , nanotechnology , physics , nuclear physics , geometry , mathematics , quantum mechanics , pure mathematics , electron
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