Open AccessCharacterizing mid-circuit measurements with a new form of gate set tomography Part 2: Experiment.
Author(s) -
Guilhem Ribeill,
Matthew Ware,
Luke C. G. Govia,
Kenneth Rudinger,
Timothy Proctor,
Thomas Ohki
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1855325
Subject(s) - set (abstract data type) , computer science , tomography , logic gate , electrical engineering , physics , algorithm , engineering , optics , programming language
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