Open AccessExtraction of Data-Driven Compact Models from High-Fidelity Semiconductor Simulations with Topological Data Analysis.
Author(s) -
Andy Huang,
Nathaniel Trask,
Xujiao Gao,
Shahed Reza,
Ian Wilcox,
Candace Diaz
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1854316
Subject(s) - topological data analysis , fidelity , computer science , data extraction , extraction (chemistry) , data modeling , high fidelity , topology (electrical circuits) , data mining , algorithm , engineering , telecommunications , electrical engineering , database , chemistry , medline , chromatography , political science , law
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