High-Resolution Magnetic Microscopy for Hardware Security and Other Sandia Applications.
Author(s) -
Pauli Kehayias
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1835222
Subject(s) - resolution (logic) , microscopy , computer science , hardware security module , computer hardware , physics , optics , artificial intelligence , cryptography , computer security
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