Open AccessChallenges of Interpreting and Applying New J-STD-001 Cleanliness Standards in High Reliability Applications
Author(s) -
William Capen
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1833396
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics
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