Open AccessShielded and Low-Damping SPM Probes for Quantitative Electrical and Electrochemical Characterization (Phase IIA)
Author(s) -
Dominik Ziegler
Publication year - 2021
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Reports
DOI - 10.2172/1832332
Subject(s) - nanotechnology , nanoscopic scale , materials science , characterization (materials science) , shielded cable , fabrication , electrical conductor , chip , leakage (economics) , electrical contacts , optoelectronics , electrical engineering , engineering , medicine , alternative medicine , pathology , economics , composite material , macroeconomics
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