Open AccessMultiscale System Modeling of Single Event Induced Faults in Advanced Node Processors.
Author(s) -
Matthew Can,
Arun Rodrigues,
Dolores A. Black,
J. D. Black,
Luis Bustamante,
Benjamin Feinberg,
Heather Quinn,
Clark Lawrence,
John Brunhaver,
Barnaby Hugh,
Michael Lee McLain,
Sapan Agarwal,
Matthew Marinella
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.2172/1831591
Subject(s) - microprocessor , computer science , node (physics) , single event upset , transistor , embedded system , computer architecture , computer hardware , engineering , electrical engineering , static random access memory , structural engineering , voltage
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