Spectral Line Identification in Photoionized Silicon Plasma Emission.
Author(s) -
Patricia Cho
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.2172/1830899
Subject(s) - silicon , plasma , identification (biology) , line (geometry) , emission spectrum , plasma diagnostics , spectral line , materials science , atomic physics , physics , optoelectronics , nuclear physics , astronomy , botany , biology , geometry , mathematics
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